
Optical
Sheffield

Micro-PL Setup for measuring single Quantum Dots (500-1650nm)
- Nano-positioning stage XYZ: 300um range, <10nm res.
- Double spectrometer (~ 0.005nm res.)


Mid-IR low-temp PL & EL (2-5.5µm)
- a wide variety of excitation lasers including tuneable output supercontinuum laser (800-2400 nm)
- 3 different detectors for wide wavelength coverage
- Reflectivity measurements (1000-5000 nm)


Wafer-scale low temperature PL system for full 2” and 3” wafers:
- Full wafer PL mapping (500-1650nm)
- Low temperature reflectivity measurements
- Macro or micro-PL configuration
- New Time-resolved PL capability (800-1600nm) for measuring carrier dynamics and lifetime
Accent/Nanometrics RPM2000 PL Mappers
Fast room temperature PL characterization and mapping of 2, 3 & 4” wafers
- 405, 532, 660 & 980nm lasers
- Si CCD detectors, 500 – 1000nm
- InGaAs array detectors, 900 – 2650nm


Cambridge
Accent/Nanometrics RPM2000 PL Mapper
- Fast room temperature PL characterization and mapping of 2, 3, 4 and 6” wafers
- 266 nm laser for PL excitation
- White light source for reflectivity mapping
UCL

Nanometrics RPM2000 rapid photoluminescence mapper
- Three lasers (532 nm, 635 nm, and 980 nm) and two detectors (CCD and extended InGaAs detectors)
- A wide measurement range from 600 to 2100 nm
- Mapping of up to 6” wafers
- High spatial (100 µm) and spectral resolution PL mappings