Characterization Sheffield PL-Mapper-3

Optical

Sheffield

Characterization Sheffield-Princeton-double-spectrometer-and-detectors
Princeton double spectrometer and detectors 

Micro-PL Setup for measuring single Quantum Dots (500-1650nm)

  • Nano-positioning stage XYZ: 300um range, <10nm res.
  • Double spectrometer (~ 0.005nm res.)
Montana cryostation and micro-PL stage
Micro-PL setup overview

Mid-IR low-temp PL & EL (2-5.5µm)

  • A wide variety of excitation lasers including tuneable output supercontinuum laser (800-2400 nm)
  • 3 different detectors for wide wavelength coverage 
  • Reflectivity measurements (1000-5000 nm)

Wafer-scale low temperature PL system for full 2” and 3” wafers:

  • Full wafer PL mapping (500-1650nm)
  • Low temperature reflectivity measurements
  • Macro or micro-PL configuration
  • New Time-resolved PL capability (800-1600nm) for measuring carrier dynamics and lifetime 

Accent/Nanometrics RPM2000 PL Mappers

Fast room temperature PL characterization and mapping of 2, 3 & 4” wafers

  • 405, 532, 660 & 980nm lasers 
  • Si CCD detectors, 500 – 1000nm
  • InGaAs array detectors, 900 – 2650nm
Accent/Nanometrics RPM2000 PL Mapper
Characterization Sheffield PR421_PL-Map
Typical wafer PL map data

Cambridge

Accent/Nanometrics RPM2000 PL Mapper

  • Fast room temperature PL characterization and mapping of 2, 3, 4 and 6” wafers
  • 266 nm laser for PL excitation
  • White light source for reflectivity mapping

UCL

Nanometrics RPM2000 rapid photoluminescence mapper

  • Three lasers (532 nm, 635 nm, and 980 nm) and two detectors (CCD and extended InGaAs detectors)
  • A wide measurement range from 600 to 2100 nm
  • Mapping of up to 6” wafers
  • High spatial (100 µm) and spectral resolution PL mappings